JEOL: Release of a New Schottky Field Emission(FE) Scanning Electron M…
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2019.08.04 17:00
JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-F100 in August 2019.
https://www.jeol.co.jp/en/news/detail/20190804.3456.html
Background
Scanning electron microscopes(SEMs) are used in various fields; nanotechnology, metals, semiconductors, ceramics, medicine, and biology. With application expansion, SEM users are in need of fast high-quality data acquisition and simple compositiona...
