JEOL: Release of the New Scanning Electron Microscope JSM-IT700HR

JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in August 2020. Development background Scanning electron microscopes are used in various fields, such as nanotechnology, metals, semiconductors, ceramics, medicine, and biology. In addition, SEM applications are expanding to include quality control as well as basic research. The demands are increasing for faster data acquis...